Synthesis of pure Cu2O thin layers controlled by in-situ conductivity measurements

被引:11
|
作者
Labidi, A. [1 ,2 ]
Ouali, H. [1 ,2 ]
Bejaoui, A. [1 ,2 ]
Wood, T. [2 ]
Lambert-Mauriat, C. [2 ]
Maaref, M. [1 ]
Aguir, K. [2 ]
机构
[1] Univ Carthage, Lab Mat Mol & Applicat IPEST, Tunis 2070, Tunisia
[2] Univ Aix Marseille, CNRS, IM2NP, UMR 7334,Fac Sci, F-13397 Marseille 20, France
关键词
Thermal annealing; Cu2O; X-ray diffraction; In-situ conductivity; SEM; ELECTROCHEMICAL DEPOSITION; CUO NANOWIRES; FILMS; OXIDATION; COPPER; NANOPARTICLES;
D O I
10.1016/j.ceramint.2013.12.130
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
An easy synthesis route for cuprous oxide (Cu2O) nanoparticles is reported via thermal annealing improved and controlled by in-situ conductivity measurements. The crystalline structure, phase transition, surface morphology and particle size/shape, were investigated through X-ray diffraction, a conductivity setup and scanning electron microscopy, respectively. X-ray diffraction patterns revealed that initial metallic Cu nanoparticles were transformed to Cu2O nanoparticles with high purity, under specific conditions critically dependent on the temperature and annealing duration. This transformation was also dependent on the film thickness and atmospheric composition in the test chamber during the annealing process. (C) 2013 Elsevier Ltd and Techna Group S.r.l. All rights reserved.
引用
收藏
页码:7851 / 7856
页数:6
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