PDMS;
pattern;
printing;
wettability;
Au nanoparticle;
VUV-exposure;
D O I:
暂无
中图分类号:
TB3 [工程材料学];
学科分类号:
0805 ;
080502 ;
摘要:
This paper dealt with exposure of a nanometer-level flat cross-linked poly(dimethylsiloxane) film to vacuum ultraviolet light (VUV) at a wavelength of 172 nm and its application to printing of Au nanoparticles. FTIR and contact angle measurements allowed us to confirm the formation of a silica outermost layer on the PDMS film due to photo-oxidation of a methylsilyl group to a silanol group and condensation to a Si-O-Si moiety. It was indicated by AFM observation on a PDMS film surface patterned by imagewise VUV-exposure that the height of VUV-exposed regions was lower than that of unexposed regions by approximately 10 nm due to shrinkage by condensation among the photogenerated silanol groups. Location-selective inking of an Au-nanoparticle/toluene solution was possible on the VUV-exposed patterned PDMS surfaces. Au-nanoparticle micropatterns in about 30 Pm size were successfully transcribed on a silica substrate surface from the inked PDMS film.
机构:
Indian Assoc Cultivat Sci, Polymer Sci Unit, Kolkata 700032, W Bengal, IndiaIndian Assoc Cultivat Sci, Polymer Sci Unit, Kolkata 700032, W Bengal, India
Chatterjee, Uma
Jewrajka, Suresh K.
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机构:
Indian Assoc Cultivat Sci, Polymer Sci Unit, Kolkata 700032, W Bengal, IndiaIndian Assoc Cultivat Sci, Polymer Sci Unit, Kolkata 700032, W Bengal, India