共 50 条
- [31] Determination of secondary-ions yield in SIMS depth profiling of Si, Mg, and C ions implanted GaN epitaxial layers 2018 12TH INTERNATIONAL CONFERENCE ON ADVANCED SEMICONDUCTOR DEVICES AND MICROSYSTEMS (ASDAM), 2018, : 141 - 144
- [33] ATOMIC HELIUM SCATTERING AND DIFFRACTION FROM SOLID SURFACES JOURNAL OF PHYSICS PART C SOLID STATE PHYSICS, 1972, 5 (16): : 2098 - &
- [37] ON THE FORMATION OF POLYATOMIC IONS FROM SOLID-SURFACES NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1994, 88 (1-2): : 55 - 60
- [39] Secondary electron emission from solid metal surfaces PROCEEDINGS OF THE CAMBRIDGE PHILOSOPHICAL SOCIETY, 1929, 25 : 237 - 254
- [40] ATOMIC COLLISION PROCESSES OCCURRING IN GAS DISCHARGES SPECTROCHIMICA ACTA, 1957, 8 (06): : 392 - 392