Low Coherence Interferometry for the Inline Measurement of Translucent Multilayer Structures

被引:0
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作者
Hoelters, S.
Farkas, C.
Fleige, R.
Lenenbach, A.
Noll, R.
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T [工业技术];
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08 ;
摘要
In a joint national project with industrial partners in the sectors of sensor technology, mechanical engineering and plastic film production, the Fraunhofer Institute for Laser Technology (ILT) has developed a novel optical sensor to monitor the production of plastic films based on interferometric measurements with low coherent radiation [1]. This technique of Optical Coherence Tomography (OCT) is an imaging method generating high-resolution tomography scans. The sensor measures the thicknesses of single layers in multilayer films allowing for the first time inline process monitoring and efficient process guiding of flat-film and blow-film extrusion lines.
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页码:161 / 168
页数:8
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