X-ray photoelectron spectroscopy of Zn1-xCdxSe thin films

被引：21
|
作者：
Islam, R [1 ]
Rao, DR [1 ]
机构：
[1] INDIAN INST TECHNOL,CTR MAT SCI,KHARAGPUR 721302,W BENGAL,INDIA
来源：
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1996年 / 81卷 / 01期
关键词：
Auger parameter; electron beam; thin film; Zn1-xCdxSe; XPS;
D O I：
10.1016/0368-2048(95)02551-0
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
X-ray photoelectron spectra (XPS) have been recorded for electron beam deposited Zn1-xCdxSe (0 < x < 1) thin films on glass substrates at room temperature. The chemical composition (x), core level binding energies, Auger parameter (ct) and ionicity (f(i)) have been estimated from XPS data of these films. The films in general have shown selenium deficiency for all the compositions. The variation in Auger parameter for Zn, Cd and Se in the thin films with different compositions is not significant and is found to be for Zn (2011.3-2012.2 eV), for Cd (786.1-786.6 eV) and for Se (1360.2-1361.4 eV). The f(i) values are in the range 0.639-0.680 depending upon the composition of the films. The effect of argon ion bombardment on composition has been investigated.
引用
收藏
页码：69 / 77
页数：9
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