Magnetoresistance of Fe thin films on faceted Al2O3 substrates

Nanopatterned Fe thin films are prepared by e-beam evaporation on faceted Al(2)O(3) substrates. In situ scanning tunneling microscopy investigations show that the Fe morphology consists of a grain structure which follows the shape of the substrate facets. By four-circle x-ray diffraction we demonstrate that the grains are textured with different but defined alignments. The facet morphology results in a pronounced magnetic anisotropy as shown by magnetization loops measured in a vibrating sample magnetometer. The morphology in conjunction with a conventional anisotropic magnetoresistance effect is the origin of a strongly anisotropic magnetoresistance of the samples. (C) 2009 American Institute of Physics. [DOI: 10.1063/1.3151708]