High Resolution Silicon-on-Insulator Mid-Infrared Spectrometers operating at 3.3 μm

被引：0
|
作者：
Vasiliev, Anton [1 ]
Muneeb, Muhammad
Baets, Roel
Roelkens, Gunther
机构：
[1] Univ Ghent, IMEC, Photon Res Grp, Technol Pk Zwijnaarde 15, B-9052 Ghent, Belgium
来源：
2017 IEEE PHOTONICS SOCIETY SUMMER TOPICAL MEETING SERIES (SUM) | 2017年
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The characterization of silicon-on-insulator arrayed waveguide grating wavelength (de) multiplexers operating at 3.3 mu m is reported. The filters have a channel spacing between 200 GHz and 50 GHz and feature low insertion loss (2-3dB), low crosstalk level (20 dB) and low waveguide loss (2.6 dB/cm).
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页码：177 / 178
页数：2
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