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Atomic Force Microscopy (AFM) the Ultimate Nano Toolkit

被引：1
|
作者：
Gerber, Christoph [1 ]
机构：
[1] Univ Basel, Swiss Nano Inst, Inst Phys, CH-4003 Basel, Switzerland
来源：
SCIENCE OF ADVANCED MATERIALS | 2017年 / 9卷 / 01期
关键词：
D O I：
10.1166/sam.2017.3018
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：55 / 55
页数：1
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