Atomic Force Microscopy (AFM) the Ultimate Nano Toolkit

被引：1

|

作者：

Gerber, Christoph ^{[1
]}

机构：

[1] Univ Basel, Swiss Nano Inst, Inst Phys, CH-4003 Basel, Switzerland

来源：

SCIENCE OF ADVANCED MATERIALS | 2017年 / 9卷 / 01期

关键词：

D O I：

10.1166/sam.2017.3018

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

收藏

页码：55 / 55

页数：1

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