LOW-RANK SIFT: AN AFFINE INVARIANT FEATURE FOR PLACE RECOGNITION

In this paper, we study the problem of recognizing man-made objects and present a novel affine-invariant feature, Low-rank SIFT, which exploits the regular appearance property in man-made objects. The proposed feature achieves full affine invariance without needing to simulate over affine parameter space. We rectify local patches by converting them to their low-rank forms to achieve skew invariance, and perform the way similar to conventional SIFT to resolve rotation, translation and scaling ambiguity. The main contributions lie in two-fold: our method seeks to leverage low-rank prior to estimate affine parameters for local patches directly and we propose a fast algorithm to compute such parameters by introducing the Low-rank Integral Map. Besides, we describe a pipeline of constructing a geotagged building database from the ground up. We demonstrate the effectiveness of our approach in the application to place recognition.