Learning-based Shack-Hartmann wavefront sensor for high-order aberration detection (vol 27, 33504, 2019)

被引：1
|
作者：
Hu, Lejia [1 ,2 ]
Hu, Shuwen [2 ]
Gong, Wei [3 ]
Si, Ke [1 ,2 ,3 ]
机构：
[1] Zhejiang Univ, Sch Med, State Key Lab Modern Opt Instrumentat, Affiliated Hosp 1,Dept Neurobiol, Hangzhou 310027, Peoples R China
[2] Zhejiang Univ, Coll Opt Sci & Engn, Hangzhou 310027, Peoples R China
[3] Zhejiang Univ, Sch Med, NHC & CAMS Key Lab Med Neurobiol, Ctr Neurosci,Dept Neurobiol, Hangzhou 310058, Peoples R China
来源：
OPTICS EXPRESS | 2020年 / 28卷 / 21期
关键词：
D O I：
10.1364/OE.411191
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
An erratum is presented to correct the sizes of feature maps of Fig. 1(a) in [Opt. Express 27, 33504 (2019)]. (C) 2020 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
引用
收藏
页码：32132 / 32132
页数：1
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