Multiple-wavelength-scanning-based phase unwrapping method for digital holographic microscopy

被引：14
|
作者：
Li, Yan [1 ]
Xiao, Wen [1 ]
Pan, Feng [1 ]
机构：
[1] Beihang Univ, Minist Educ, Key Lab Precis Optomech Technol, Beijing 100191, Peoples R China
来源：
APPLIED OPTICS | 2014年 / 53卷 / 05期
基金：
中国国家自然科学基金;
关键词：
QUALITY MAP; INTERFEROMETRY; RECONSTRUCTION;
D O I：
10.1364/AO.53.000979
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A phase unwrapping approach based on multiple-wavelength scanning is presented for digital holographic microscopy. It unwrapped the ambiguous phase image layer by layer by synthesizing the extracted continuous components from a set of multiple phase images obtained by varying the optical wavelength, where the discontinuities occur at different places and the phase speckle noise presents various distributions in state. The total time for data acquisition is approximately 22 min for 10 wavelengths. The simulation and experimental results demonstrate that the proposed method has a more accurate calculation and better counteraction of phase noise compared with those of previously reported approaches. In addition, the wrapped phase image of the object containing the steps has also been unwrapped successfully. (C) 2014 Optical Society of America
引用
收藏
页码：979 / 987
页数：9
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