Electron tomography of lead nano-inclusions in aluminium

被引：7
|
作者：
Roesner, Harald [1 ]
Scherer, Torsten [2 ]
Wilde, Gerhard [1 ]
机构：
[1] Univ Munster, Inst Mat Phys, D-48149 Munster, Germany
[2] Forschungszentrum Karlsruhe Helmholtz Gemeinschaf, Inst Nanotechnol, D-76344 Eggenstein Leopoldshafen, Germany
来源：
SCRIPTA MATERIALIA | 2009年 / 60卷 / 03期
关键词：
Nanostructure; Interface structure; High-angle annular dark-field; Electron tomography; NANOSCALE PB INCLUSIONS; AL; NANOPARTICLES; NANOCRYSTALS; INTERFACES; SHAPES; IMPACT;
D O I：
10.1016/j.scriptamat.2008.09.025
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
High-angle annular dark-field scanning transmission electron microscopic tomography is a powerful technique that has been developed to characterize three-dimensional structures in materials science on a nanometer scale. We have applied this technique to investigations of Al-Pb composites containing 1 at.% Pb in the form of nanometer-sized inclusions. We present detailed tomographic analyses that reveal different three-dimensional morphologies of the Pb inclusions produced by high-energy ball milling. These results are discussed regarding the interface-controlled melting behavior of embedded inclusions. (C) 2008 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码：168 / 170
页数：3
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