X-ray resonant Raman scattering from noble gas atoms and beyond

被引：8
|
作者：
Zitnik, M. [1 ]
Kavcic, M. [1 ]
Bucar, K. [1 ]
Mihelic, A. [1 ]
机构：
[1] Jozef Stefan Inst, SI-1000 Ljubljana, Slovenia
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2009年 / 267卷 / 02期
关键词：
High resolution X-ray spectroscopy; Inelastic X-ray scattering; Resonant X-ray scattering; ARGON; DECAY; EXCITATIONS; HELIUM; SULFUR; XENON; STATE; EDGE;
D O I：
10.1016/j.nimb.2008.10.074
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
We discuss general characteristics of the resonant X-ray scattering and briefly illustrate its applications in atomic, molecular and solid state physics by a few selected examples. The Ljubljana high resolution spectrometer set-up is presented, which was recently employed at ELETTRA and ESRF synchrotron beamlines to study X-ray emission of inner-shell excited states of xenon and argon, and of simple sulfur containing molecules and solid compounds. (C) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码：221 / 225
页数：5
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