Measuring the Residual Phase Noise of Photodiodes Using Two-Tone Correlation Method

被引：1
|
作者：
Zhu Dezhao [1 ]
Yang Chun [1 ]
Cao Zhewei [1 ]
Li Xianghua [1 ]
机构：
[1] Southeast Univ, Sch Elect Sci & Engn, Nanjing 210018, Peoples R China
来源：
IEEE PHOTONICS TECHNOLOGY LETTERS | 2014年 / 26卷 / 22期
关键词：
Residual phase noise; nonlinearity; photodiode; two-tone; correlation; NONLINEARITY; AMPLITUDE;
D O I：
10.1109/LPT.2014.2354518
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this letter, we propose a novel approach to measure the residual phase noise (RPN) of a photodiode (PD) using two-tone correlation method. Based on this method, the phase noises of the microwave sources and noise contributions from other components in different paths are suppressed mostly because they are all uncorrelated while the RPN of the PD is preserved. We have measured the RPNs of the PD with different incident optical power to find out the relationship between the RPN and RF tone compression due to the nonlinearity of the PD. The RPN varies significantly along with the increase of RF compression. The RPN jumps up by 15 dB when the RF compression is 1.9 dB compared with 0.2 dB.
引用
收藏
页码：2264 / 2266
页数：3
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