Influences of graded superlattice on the electrostatic discharge characteristics of green InGaN/GaN light-emitting diodes

被引:10
|
作者
Lee, Kwanjae [1 ,2 ,3 ]
Lee, Cheul-Ro [1 ,2 ]
Chung, Tae-Hoon [3 ]
Park, Jinyoung [3 ]
Leem, Jae-Young [4 ]
Jeong, Kwang-Un [5 ,6 ]
Kim, Jin Soo [1 ,2 ]
机构
[1] Chonbuk Natl Univ, Div Adv Mat Engn, Jeonju 561756, South Korea
[2] Chonbuk Natl Univ, RCAMD, Jeonju 561756, South Korea
[3] Korea Photon Technol Inst, Gwangju 500779, South Korea
[4] Inje Univ, Sch Nano Engn, Gimhae 621749, South Korea
[5] Chonbuk Natl Univ, Dept Polymer Nano Sci & Technol, Jeonju 561756, South Korea
[6] Chonbuk Natl Univ, Polymer Mat Fus Res Ctr, Jeonju 561756, South Korea
基金
新加坡国家研究基金会;
关键词
Electrostatic discharge; Superlattices; Metalorganic vapor phase epitaxy; Light emitting diodes; NITRIDE-BASED LEDS; MQW LEDS; PROTECTION;
D O I
10.1016/j.jcrysgro.2017.02.003
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
In this paper, the influence of a Si-doped graded superlattice (SiGSL) on the electrostatic discharge (ESD) characteristics of green InGaN/GaN light-emitting diodes (LEDs) is discussed. To investigate the effects of Si doping to the superlattice, green LEDs were also fabricated on undoped graded superlattice (unGSL). Furthermore, a conventional green InGaN/GaN LED without the superlattice (C-LED), emitting at a wavelength of 534 nm, was also prepared as a reference. The current-voltage (I-V) curves for the C-LED and the unGSL-LED subjected to the ESD treatments at surge voltages from 2000 to 8000 V showed a drastic increase in the leakage current. However, there was relatively small change in the I-V curves for the SiGSL-LED after the ESD treatments, even at the surge voltages of 6000 and 8000 V. After the ESD treatment at a surge voltage of 8000 V, the EL intensities for the C-LED, unGSL, and SiGSL, measured at a driving current of 120 mA, were reduced by 55, 53, and 30%, respectively, compared to those of the as-fabricated LEDs.
引用
收藏
页码:138 / 142
页数:5
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