Monitoring linear profiles using an adaptive control chart

被引：10

作者：

De Magalhaes, Maysa S. ^{[1
]}

Von Doellinger, Rodrigo Otavio S. ^{[2
]}

机构：

[1] Brazilian Inst Geog & Stat IBGE, Natl Sch Stat Sci ENCE, BR-20231050 Rio De Janeiro, RJ, Brazil

[2] Brazilian Inst Geog Stat IBGE, Div Methods & Qual, Rio De Janeiro, RJ, Brazil

来源：

INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY | 2016年 / 82卷 / 5-8期

关键词：

Statistical process control; Linear profile; Variable sample size; Chi-squared control chart; Markov chain; ECONOMIC-STATISTICAL DESIGN; T-2 CONTROL CHART; (X)OVER-BAR; MODEL;

D O I：

10.1007/s00170-015-7429-z

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

We propose a model for the statistical design of a variable sample size chi-squared control chart (VSS chi(2) control chart) for monitoring linear profiles. Performance measures of the proposed adaptive control chart are obtained through a Markov chain approach. Through a numerical example, which consists of a calibration application in a production process of semiconductors, the proposed chart is compared to the fixed parameter chi-squared control chart (FP chi(2) chart) to monitor the intercept and slope of the linear profile. From this example, it is possible to assess the potential benefits provided by the proposed chart. Also, considering simultaneous shifts in the intercept, the slope, and the standard deviation, a sensitivity analysis of the proposed chart for monitoring linear profiles is presented.

引用

页码：1433 / 1445

页数：13

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