A Comprehensive Design-for-Test Infrastructure in the Context of Security-Critical Applications

被引：0

作者：

Saeed, Samah Mohamed ^{[1
,2
]}

Sinanoglu, Ozgur ^{[3
,4
]}

机构：

[1] Univ Washington, Inst Technol, Comp Engn, Tacoma, WA USA

[2] NYU, Polytech Sch Engn, Comp Sci & Engn, New York, NY USA

[3] NYU, Elect & Comp Engn, Abu Dhabi, U Arab Emirates

[4] Univ Calif San Diego, Comp Sci & Engn, La Jolla, CA USA

来源：

IEEE DESIGN & TEST | 2017年 / 34卷 / 01期

关键词：

SCAN; ARCHITECTURE; COMPACT;

D O I：

10.1109/MDAT.2016.2527708

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Editor's note: Testability is a perennial concern that requires ever-improved solutions; however, potentially resultant security vulnerabilities need to be considered as well. This article provides a compact look at a body of DfT work from lead practitioners in the field. The DfT strategies address predicting and controlling test data volume and reducing power. Potential impacts of DfT to security are considered, along with strategies for providing testability without sacrificing security. © 2016 IEEE.

引用

页码：57 / 64

页数：8

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