Fabrication of titanium zinc oxide (TZO) sol-gel derived nanostructured thin film and investigation of its optical and electrical properties

In this research, titanium zinc oxide nanostructured thin film (0.5 wt% Ti) was deposited on glass substrate by a sol-gel method. The structure, morphology, surface roughness, and surface composition of the thin films were investigated by X-ray diffraction, field emission scanning electron microscopy, energy-dispersive X-ray spectroscopy and atomic force microscopy. The optical and electrical properties of the thin films were investigated by UV NIR spectrophotometer and I-V characteristics. The X-ray diffraction pattern showed that the titanium zinc oxide thin film had a polycrystalline structure. The optical and electrical results indicated that titanium addition increased the band gap of the zinc oxide from 3.340 to 3.346 eV whereas resistivity of zinc oxide decreased from 8.2 x 10(4) to 3.8 x 10(4) Omega cm. (C) 2015 Elsevier GmbH. All rights reserved.