A defect inspection technique using polarized images for steel strip surface

被引:4
|
作者
Kazama, A. [1 ]
Oshige, T. [1 ]
机构
[1] JFE R&D Corp, Kawasaki Ku, Kawasaki, Kanagawa 2100855, Japan
来源
OPTICS AND PHOTONICS FOR INFORMATION PROCESSING II | 2008年 / 7072卷
关键词
surface inspection; detection; defect; polarization; light; ellipsometry; image; steel strip;
D O I
10.1117/12.794685
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
An in-line defect inspection technique using polarized images for steel strip surface is developed. In inspection for low contrast defects, excessive-detection will be caused by harmless patterns such as slight oil patterns, chemical liquid patterns, and other patterns. We have adopted quasi-ellipsometric method using polarized images of the target samples to obtain their ellipsometric parameters, and found that the ellipsometric characteristics of the defects and the harmless patterns differ from each other. Based on this finding, we have developed an inspection system utilizing three polarized images with different azimuth angles to discriminate defects from harmless patterns at a high-speed production line.
引用
收藏
页数:9
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