Influence of undoped GaN layer thickness to the performance of AlGaN/GaN-based ultraviolet light-emitting diodes

被引:9
|
作者
Liu, YH
Li, HD
Ao, JP
Lee, YB
Wang, T
Sakai, S
机构
[1] Univ Tokushima, Satellite Venture Business Lab, Tokushima 7708506, Japan
[2] Univ Tokushima, Dept Elect & Elect Engn, Tokushima 7708506, Japan
[3] Univ Sheffield, Natl Ctr Technol 3 5, Sheffield S10 2TN, S Yorkshire, England
关键词
defects; transmission electron microscopy; superlattice; nitride; light emitting diodes;
D O I
10.1016/j.jcrysgro.2004.04.103
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Structural and optical properties of AlGaN-based ultraviolet (UV) light-emitting diodes (LEDs) with a thin undoped GaN layer and thick n-type AlGaN/GaN superlattices have been investigated. Some V-defects were observed in the n-type superlattice layers. The V-defect density decreases enormously with increasing the undoped GaN thickness. Simultaneously, the output power of the UV-LEDs increases remarkably as the undoped GaN thickness increases. Since the threading dislocation density is the same for all the LEDs, the improved LED performance could be attributed to the largely reduced V-defect density. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:30 / 34
页数:5
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