Thermal activation of beryllium in GaN grown by rf-plasma molecular beam epitaxy

被引:0
|
作者
VanMil, BL [1 ]
Lee, K [1 ]
Wang, LJ [1 ]
Giles, NC [1 ]
Myers, TH [1 ]
机构
[1] W Virginia Univ, Dept Phys, Morgantown, WV 26506 USA
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中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Differences in the optical activity of Be in GaN epilayers grown on different surface polarities by rf-plasma molecular beam epitaxy are investigated. Nitrogen-polar GaN doped with Be exhibits a significantly higher intensity of donor-acceptor pair (DAP) photoluminescence (PL) than similarly doped Ga-polar GaN, indicating the Be is incorporating at microscopically different sites, or possibly is forming different compensating complexes. Highly Be-doped Ga-polar GaN apparently forms isolated polarity-inverted regions which then incorporate Be via the N-polar mechanism resulting in the DAP PL. High temperature annealing of the Ga-polar layers both under nitrogen/hydrogen mixtures and under pure nitrogen atmospheres activates the DAP PL.
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页码:503 / 508
页数:6
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