Influence of simultaneous mechanical and electrical straining on conventional thick-film resistors

被引：0
|
作者：
Stanimirovic, Zdravko [1 ]
Jevtic, Milan M. [2 ]
Stanimirovic, Ivanka [1 ]
机构：
[1] IRITEL AD, Batajnicki Put 23, Belgrade 11080, Serbia
[2] Inst Phys, Belgrade 11080, Serbia
来源：
2006 25TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, VOLS 1 AND 2, PROCEEDINGS | 2006年
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D O I：
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper the results from a study of simultaneous mechanical and electrical straining effects on performances of conventional thick-film resistors based on resistor composition with sheet resistance of 1k Omega/sq are presented. For experimental purposes a series of thick-film test resistors with different geometries were realized and subjected to simultaneous electrical and mechanical straining using 1.2/50 mu s pulses in combination with mechanical substrate deflection of 300 mu m. Obtained experimental results were analyzed and correlation between resistance, noise index and gauge factor changes with resistor degradation due to simultaneous impact of these two types of straining were observed.
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页码：627 / +
页数：2
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