Simultaneous mechanical and electrical straining of conventional thick-film resistors

In this paper results from the study of simultaneous mechanical and electrical straining effects on performances of conventional thick-film resistors based on three different resistor compositions with sheet resistances of 1 k Omega/sq, 10 k Omega/sq and 100 k Omega/sq are presented. For experimental purposes thick-film test resistors of different dimensions were realized. Resistors were simultaneously subjected to mechanical straining with maximal substrate deflection of 300 mu m and multiple high-voltage pulses. Obtained experimental results are analyzed from micro- and macrostructural, charge transport and low-frequency noise aspects. Correlations between resistance, gauge factor and low-frequency noise changes with resistor degradation due to simultaneous mechanical and electrical straining are observed. (c) 2006 Elsevier Ltd. All rights reserved.