An Analysis on Measurement Sensitivity of Short-Pulse Propagation Technique Using a Virtual Test Bench

被引：0

作者：

Zhou, Zhen ^{[1
]}

Deutsch, Alina ^{[2
]}

Melde, Kathleen L. ^{[1
]}

Katopis, George A. ^{[3
]}

Morscy, Jason D. ^{[2
]}

机构：

[1] Univ Arizona, Dept Elect & Comp Engn, Ctr Elect Packaging Res, Tucson, AZ 85721 USA

[2] IBM Corp, Thomas J Watson Res Ctr, Box 218, Yorktown Hts, NY 10598 USA

[3] IBM Syst & Technol Grp, Poughkeepsie, NY 12601 USA

来源：

2008 IEEE-EPEP ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING | 2008年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents the concept of using a virtual test bench to emulate measurements via simulation and modeling. For demonstration purposes, this idea is used to quantify the measurement sensitivity of the Short-Pulse Propagation technique to the line parameter tolerances found in production level circuit boards without building the hardware. This method is applicable to other measurement methodologies such as in the calibration and deembedding steps of frequency-domain characterization.

引用

页码：197 / +

页数：2

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