XRD, XANES AND EXAFS STUDY OF NiO XEROGELS.

被引：0
|
作者：
Fischer, H. [1 ]
Craievich, A. F. [1 ]
Sharma, P. K. [2 ]
机构：
[1] Inst Fis, BR-05315970 Sao Paulo, SP, Brazil
[2] SUNY Binghamton, Mat Ctr, Binghamton, NY USA
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 1999年 / 55卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
P07.10.004
引用
收藏
页码：474 / 474
页数：1
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