Coupled electron and thermal transport simulation of self-heating effects in junctionless MOSFET

被引:7
|
作者
Mohamed, M. [1 ]
Aksamija, Z. [2 ]
Ravaioli, U. [1 ,3 ]
机构
[1] Univ Illinois, Beckman Inst, Urbana, IL 61801 USA
[2] Univ Massachusetts, Elect & Comp Engn Dept, Amherst, MA 01003 USA
[3] Univ Illinois, Dept Elect & Comp Engn, Urbana, IL 61801 USA
关键词
D O I
10.1088/1742-6596/647/1/012026
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
This paper explores self-heating effects on junctionless gate-all-around nanowire MOSFET using self-consistently coupled 3D full band electro-thermal transport. The self-consistent algorithm begins by supplying the heat generation data from the 3D electron Monte Carlo with 2D quantum correction to the phonon Monte Carlo. Subsequently, the phonon Monte Carlo transports the phonons introduced from the electron simulation and considers their scattering through the anharmonic three-phonon processes. The anharmonic three-phonon decay and the use of full dispersion facilitate a detailed description of heat transfer and the determination of the temperature map. We compare the performance of gate-all-around junctionless against the conventional inversion mode gate-all-around MOSFET. Our results indicate that junctionless MOSFET has less self-heating effects than the conventional inversion mode device, particularly at the limits of high currents.
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页数:4
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