A method for the non-destructive analysis of gradients of mechanical stresses by X-ray diffraction measurements at fixed penetration/information depths

被引：0
|
作者：
Kumar, A. [1 ]
Welzel, U. [1 ]
Mittemeijer, E. J. [1 ]
机构：
[1] Max Planck Inst Met Res, D-70569 Stuttgart, Germany
来源：
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2006年 / 39卷
关键词：
D O I：
10.1107/S0021889806023417
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
A rigorous measurement strategy for (X-ray) diffraction stress measurements at fixed penetration/information depths has been developed. Thereby errors caused by lack of penetration-depth control in traditional (X-ray) diffraction (sin(2)psi) measurements have been annulled. The range of accessible penetration/information depths and experimental aspects have been discussed. As a practical example, the depth gradient of the state of residual stress in a sputter-deposited nickel layer of 2 mu m thickness has been investigated by diffraction stress measurements with uncontrolled penetration/information depth and two controlled penetration/information depths corresponding to about one quarter and one tenth of the layer thickness, respectively. The decrease of the planar tensile stress in the direction towards the surface could be well established quantitatively.
引用
收藏
页码：633 / 646
页数：14
相关论文
共 50 条
  • [1] Depth dependence of elastic grain interaction and mechanical stress: Analysis by x-ray diffraction measurements at fixed penetration/information depths
    Kumar, A.
    Welzel, U.
    Mittemeijer, E.J.
    Journal of Applied Physics, 2006, 100 (11):
  • [2] Depth dependence of elastic grain interaction and mechanical stress: Analysis by x-ray diffraction measurements at fixed penetration/information depths
    Kumar, A.
    Welzel, U.
    Mittemeijer, E. J.
    JOURNAL OF APPLIED PHYSICS, 2006, 100 (11)
  • [3] Mechanical stress gradients in thin films analyzed employing X-ray diffraction measurements at constant penetration/information depths
    Wohlschloegel, M.
    Baumann, W.
    Welzel, U.
    Mittemeijer, E. J.
    RESIDUAL STRESSES VII, 2006, 524-525 : 19 - 24
  • [4] Non-destructive analysis of surface stresses using grazing incident x-ray diffraction
    Braham, C
    Baczmanski, A
    Seiler, W
    Shiraki, N
    RESIDUAL STRESSES VII, PROCEEDINGS, 2005, 490-491 : 143 - 148
  • [5] Implication of X-ray Diffraction Method for Non-Destructive Testing While Conducting Mechanical Laboratory Tests
    Anoshki, A. N.
    Osokin, V. M.
    Tretyakov, A. A.
    Pelenev, K. A.
    Salnikov, A. F.
    5TH INTERNATIONAL CONFERENCE ON X-RAY, ELECTROVACUUM AND BIOMEDICAL TECHNIQUE, 2019, 2089
  • [6] Non-destructive phase analysis and residual stresses measurement using grazing angle X-ray diffraction geometry
    Skrzypek, SJ
    Jelenkowski, J
    Borowski, T
    Ratuszek, W
    Wierzchon, T
    ZEITSCHRIFT FUR KRISTALLOGRAPHIE, 2006, : 375 - 380
  • [7] Non-destructive statistical analysis of embedded nanoparticles by X-ray diffraction imaging
    Pelliccia, D.
    Nikulin, A. Y.
    Muddle, B. C.
    Sakata, O.
    SCRIPTA MATERIALIA, 2011, 64 (07) : 613 - 616
  • [8] Non-destructive evaluation of residual stresses in thin films via x-ray diffraction topography methds
    Tao, J.
    Lee, L.H.
    Bilello, J.C.
    Journal of Electronic Materials, 1991, 20 (07) : 819 - 825
  • [9] Non-destructive synchrotron X-ray diffraction mapping of a Roman painting
    E. Dooryhée
    M. Anne
    I. Bardiès
    J.-L. Hodeau
    P. Martinetto
    S. Rondot
    J. Salomon
    G.B.M. Vaughan
    P. Walter
    Applied Physics A, 2005, 81 : 663 - 667
  • [10] Non-destructive synchrotron X-ray diffraction mapping of a Roman painting
    Dooryhée, E
    Anne, M
    Bardiès, I
    Hodeau, JL
    Martinetto, P
    Rondot, S
    Salomon, J
    Vaughan, GBM
    Walter, P
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2005, 81 (04): : 663 - 667
12345