Surface and Interface Study of Vanadium Oxide Nano Films

被引：0
|
作者：
Oksuzoglu, Ramis Mustafa [1 ]
机构：
[1] Anadolu Univ, Dept Mat Sci & Engn, TR-26555 Eskisehir, Turkey
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2009年 / 65卷
关键词：
X-ray reflectivity; atomic force microcopy; resistivity; metal oxide thin films; sensors; TEMPERATURE;
D O I：
10.1107/S0108767309098754
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
FA2-MS07-O
引用
收藏
页码：S64 / S64
页数：1
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