CBED Tools for semi-automatic measurement of crystal thicknesses

被引:6
|
作者
Shi Honglong [1 ]
Luo Minting [2 ]
Wang Wenzhong [1 ]
机构
[1] Minzu Univ, Sch Sci, 27 Zhong Guancun South Ave, Beijing 100081, Peoples R China
[2] Chinese Acad Sci, Inst Proc Engn, Natl Engn Lab Hydromet Cleaner Prod Technol, Beijing, Peoples R China
基金
中国国家自然科学基金;
关键词
convergent-beam electron diffraction; thickness measurement; Kossel-Mollenstedt fringes; electron diffraction; computer programs; ELECTRON-DIFFRACTION;
D O I
10.1107/S1600576716019476
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Convergent-beam electron diffraction (CBED) is one of the most popular techniques to measure crystal thickness. The traditional measurement involves linear fitting of several fringes across the CBED disc, but for a thin crystal with fewer than three fringes the usefulness of this method will be limited. CBED Tools, a free plugin for the DigitalMicrograph software, provides a fast (similar to 12 min) and accurate algorithm to measure the crystal thickness on the basis of the linear fitting method, but it is also capable of determining the crystal thickness when it is very thin and only one fringe or part of the first fringe is recorded. CBED Tools can also be utilized to handle the severely distorted CBED pattern obtained when the zero-order Laue zone Kikuchi lines overlap with the fringes.
引用
收藏
页码:313 / 319
页数:7
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