Quantitative tomographic X-ray profiling of non-Bragg diffracting materials using phase retrieval X-ray diffractometry

被引:0
|
作者
Nikulin, AY [1 ]
Horney, RB
Darahanau, A
Svalbe, ID
Bigault, T
Ziegler, E
机构
[1] Monash Univ, Sch Phys & Mat engn, Monash, Vic 3800, Australia
[2] European Synchrotron Radiat Facil, F-38043 Grenoble, France
关键词
X-ray diffraction and scattering; tomography;
D O I
10.1016/j.optcom.2004.03.011
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Phase retrieval X-ray diffraction was used to profile the complex refractive index of a slice through an acetate filament sample with a square cross-section. High angular resolution X-ray Fraunhofer diffraction patterns and a logarithmic dispersion relation phase-retrieval formalism were used to recover the projection profile of the sample for each of several sample orientations. The tomographic reconstruction of the slice from these projections closely reproduced the refractive index, geometrical shape and size of the acetate filament, using only limited a priori knowledge of the sample. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:49 / 54
页数:6
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