Integral triple-crystals' X-ray diffractometry of monocrystals containing microdefects

被引：0
|
作者：
Nemoshkalenko, VV [1 ]
Molodkin, VB [1 ]
Kislovs'ky, YM [1 ]
Olikhovs'ky, SI [1 ]
Gryshchenko, TA [1 ]
Kogut, MT [1 ]
Pervak, KV [1 ]
机构：
[1] GV Kurdyumov Met Phys Inst, UA-03680 Kiev, Ukraine
来源：
METALLOFIZIKA I NOVEISHIE TEKHNOLOGII | 2000年 / 22卷 / 02期
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中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Theoretical and experimental foundations of the integral triple-crystals' X-ray diffractometry are created, and the experimental results are obtained to show possibilities of this method. In the proposed variants of the method, the separated measurements of coherent and diffuse components of the total integrated reflection power (TIRP) and their thickness dependences are realized in addition to TIRP measurements. The separation of coherent and diffuse TIRP components provides the increased sensitivity to structural imperfections of crystalline lattice in comparison with the methods of TIRP thickness dependences.
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页码：42 / 50
页数：9
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