Statistical analysis of exponential lifetimes under an integrated type-II interval censoring scheme

In this paper, we propose a new type of censoring scheme which combines the features of grouped censoring and Type-II censoring. Statistical analysis of exponentially distributed lifetimes observed under this scheme is considered. The MLE of the model parameter and its asymptotic variance are derived. Furthermore, expressions for the expected experiment time and the expected number of failures are given. A numerical study is conducted to study these quantities and the results are compared with those under a Type-II censored plan. This comparison provides useful insight on the choice of these plans in designing a life test.