共 50 条
- [32] Correction to: XUV laser mass spectrometry for nano-scale 3D elemental profiling of functional thin films [J]. Applied Physics A, 2020, 126
- [34] Nano-Scale Observation Using Near-Field Raman Microscope [J]. FERROELECTRICS, 2009, 379 : 279 - 285
- [35] Observation of nano-scale Te precipitates in cadmium zinc telluride with HRTEM [J]. MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2008, 472 (1-2): : 227 - 230
- [36] Imaging at the nano-scale [J]. PROCEEDINGS OF THE 2003 IEEE/ASME INTERNATIONAL CONFERENCE ON ADVANCED INTELLIGENT MECHATRONICS (AIM 2003), VOLS 1 AND 2, 2003, : 715 - 722