Characteristics of InAlGaAs/InAlAs superlattice avalanche photodiodes for ultra-low optical power detection in the near infrared

被引:1
|
作者
Saito, Y
Maruyama, T
Yamaki, H
Kobayashi, F
Kawahara, TD
Nomura, A
Tanaka, L
机构
[1] Shinshu Univ, Dept Informat Engn, Nagano 3808553, Japan
[2] Hioki EE Corp, R&D Off 5, Ueda, Nagano 3861192, Japan
关键词
avalanche photodiode; superlattice; InAlGaAs/InAlAs; dark current; ultra-low optical power; near infrared;
D O I
10.1007/s10043-999-0459-8
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Static characteristics of two different structured InAlGaAs/InAlAs superlattice avalanche photodiodes (SLAPDs) cooled by liquid nitrogen were evaluated at a wavelength of 1.5 mu m. The dark current of the SLAPD having a thick superlattice layer of 0.504 mu m was 5 x 10(-13) A. This was successively reduced by four orders of magnitude compared to that of the thin layer SLAPD of 0.231 mu m at a breakdown voltage of around 20 V. The thickened layer was effective in suppressing tunneling dark current. An output current of 1.7 x 10(-12) A at a bias voltage of 15 V was measured for an optical input with a wavelength of 1.5 mu m and a signal power of 1 x 10(-12) W. This showed a sharp distinction from the dark current.
引用
收藏
页码:459 / 463
页数:5
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