Micro-displacement, Stain and Stress Measurement Based on Electronic Speckle Pattern Interferometry

被引:0
|
作者
Wan Yun [1 ]
Zhao Ping [2 ]
Cui Shengfu [2 ]
Yang Yinfei [1 ]
Li Liang [1 ]
机构
[1] Nanjing Univ Aeronaut & Astronaut, Coll Mech & Elect Engn, Nanjing, Jiangsu, Peoples R China
[2] AVIC Xian Aircraft Ind Grp Co LTD, Xian, Peoples R China
关键词
ESPI; fringe pattern; stress measurement;
D O I
10.4028/www.scientific.net/MSF.770.267
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A micro-displacement, strain and stress measurement method based on electronic speckle pattern interferometry (ESPI) technique is proposed, and the measuring device is designed. Two symmetric laser beams are illuminated on the optical rough surface of a steel cantilever beam, and then speckle images are photographed by CCD. A series of filtering processing is carried out for subtracted images and FEM analysis is performed. Using the speckle fringe patterns finally achieved, displacement, strain and stress can be calculated. By comparing displacement, strain and stress measured by this method with simulation results, feasibility and engineering application value of this method have been proved.
引用
收藏
页码:267 / +
页数:2
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