Multi-physics reliability simulation for solid state lighting drivers

This paper is introducing a multi-physics reliability simulation approach for solid state lighting (SSL) electronic drivers. This work explores the system-level degradation of SSL drivers by means of applying its components reliability information into a system level simulation. Reliability information of the components such as capacitor, and inductor, defines how a component electrical behavior changes with temperature, and also with time. The purpose of this simulation is to understand the thermal electrical behavior of SSL electronic drivers through their life-time. Once the behavior of the device during its lifetime is understood, the real cause of the failure can be distinguished and possibly solved. (C) 2014 Elsevier Ltd. All rights reserved.