Microphotoluminescence characterization of alloy fluctuations in InGaAsN/GaAs quantum wells emitting at 1.3 μm

被引:0
|
作者
Frassanito, M. C.
De Giorgi, M.
Rinaldi, R.
Cingolani, R.
Rubini, S.
Piccin, M.
Cristofoli, A.
Bais, G.
Martelli, F.
Carlino, E.
Franciosi, A.
机构
[1] CNR, INFM, Natl Nanotechnol Lab, I-73100 Lecce, Italy
[2] INFM, Lab Nazl TASC, I-34012 Trieste, Italy
[3] Univ Trieste, Ctr Excellence Nanostructured Mat, I-34127 Trieste, Italy
关键词
D O I
10.1088/0268-1242/21/8/038
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Microphotoluminescence studies of annealed In( x) Ga( 1 - x) N( y) As( 1 - y)/ GaAs quantum wells fabricated by molecular beam epitaxy for optical emission in the 1.3 mu m spectral range revealed several sharp peaks about 2 - 7 meV wide in the emission spectra. The intensity of the discrete lines decreased strongly with increasing lattice temperature and was absent in as-grown ( unannealed) quantum wells. Such quantum dot-like emission lines are attributed to the recombination of excitons strongly localized at alloy fluctuations composed of In-N-rich clusters.
引用
收藏
页码:1207 / 1211
页数:5
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