Improving the testability of mixed-signal integrated circuits

被引：19
|
作者：
Roberts, GW
机构：
来源：
PROCEEDINGS OF THE IEEE 1997 CUSTOM INTEGRATED CIRCUITS CONFERENCE | 1997年
关键词：
D O I：
10.1109/CICC.1997.606616
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper presents a discussion on several methods that can be used to improve the testability of mixed-signal integrated circuits. We begin by outlining the role of test, and its impact ON product cost and quality. A brief look at the pending test crises for mixed-signal circuits is also considered Subsequently, we shall outline several common test strategies, and their corresponding test setups for verifying the function of the analog portion of a mixed-signal circuit. The remainder of the paper will describe several analog test buses and circuits for built-in self-test applications.
引用
收藏
页码：214 / 221
页数：8
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