Fabrication and characterization of freestanding NiMnGa films

被引：0
|
作者：
Rumpf, H [1 ]
Craciunescu, C [1 ]
Feydt, J [1 ]
Gilles, A [1 ]
Wuttig, M [1 ]
Quandt, E [1 ]
机构：
[1] Ctr Adv European Studies & Res, Bonn, Germany
来源：
MATERIALS AND DEVICES FOR SMART SYSTEMS | 2004年 / 785卷
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D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Freestanding Ni50Mn30Ga20 films of 13 mum thickness were fabricated by DC magnetron sputtering and analyzed. Magnetic measurements revealed the influence of the post deposition rapid thermal annealing process on the ferromagnetic hysteresis. Ferromagnetic properties evolved after annealing at 400degreesC. Thermal annealing of at least 600degreesC led to polycrystalline films that transformed reversibly and martensitically as shown by structural analysis and differential scanning calorimetry. Transformation temperatures and enthalpies of transformation of the martensitic transformation were strongly influenced by the temperature of the rapid annealing process. It is proposed that the annealing data reflect the evolution of the crystalline state.
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页码：195 / 199
页数：5
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