Monte Carlo simulation of X-ray fluorescence spectra: Part 4. Photon scattering at high X-ray energies

被引:48
|
作者
Vincze, L [1 ]
Janssens, K [1 ]
Vekemans, B [1 ]
Adams, F [1 ]
机构
[1] Univ Antwerp, Dept Chem, B-2020 Antwerp, Belgium
关键词
Monte Carlo simulation; Compton scattering; X-ray fluorescence analysis; SRXRF spectrometers;
D O I
10.1016/S0584-8547(99)00094-4
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
The photon scattering model of a Monte Carlo simulation code for synchrotron radiation X-ray fluorescence (SRXRF) spectrometers is evaluated at high X-ray energies (60-100 keV) by means of a series of validation experiments performed at Beamline BW5 of HASYLAB. Using monochromatic X-rays, Compton/Rayleigh multiple scattering experiments were performed on polypropylene, Al and Cu samples. Especially in the case of the first two matrices multiple Compton scattering occurs with high probability. This work demonstrates that the simulation model provides a reliable estimate of the spectral distribution of the multiply scattered linearly polarized photon beam as observed by an HPGe detector. Next to variations in sample composition and thickness, the ability of the code to simulate various detection geometries has also been verified. As an application of the code, the achievable detection limits of SRXRF for rare earth elements as obtained with white beam and monochromatic (80 keV) excitation are compared. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:1711 / 1722
页数:12
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