Looking into the Past

被引：0

|

作者：

Ferrero, Alessandro

机构：

来源：

IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE | 2009年 / 12卷 / 02期

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D O I：

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中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

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页码：6 / 7

页数：2

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