Quantitative measurement of linear dielectric constant using scanning nonlinear dielectric microscopy with electro-conductive cantilever

被引：16
|
作者：
Ohara, K [1 ]
Cho, Y [1 ]
机构：
[1] Tohoku Univ, Elect Commun Res Inst, Aoba Ku, Sendai, Miyagi 9808577, Japan
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2002年 / 41卷 / 7B期
关键词：
scanning nonlinear dielectric microscopy; quantitative measurement; linear dielectric constant;
D O I：
10.1143/JJAP.41.4961
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
A quantitative measurement method of the linear dielectric constant using cantilever-type scanning nonlinear dielectric microscopy (SNDM) is reported. Using this method, we succeed in quantitatively measuring the linear dielectric constant distribution of TiO2-Bi2Ti4O11 ceramics with higher resolution than that obtained with needle-type SNDM.
引用
收藏
页码：4961 / 4964
页数：4
相关论文
共 50 条
  • [1] Quantitative measurement of linear dielectric constant using scanning nonlinear dielectric microscopy with electro-conductive cantilever
    Ohara, K. (oohara@riec.tohoku.ac.jp), 1600, Japan Society of Applied Physics (41):
  • [2] Quantitative measurement of dielectric properties using scanning nonlinear dielectric microscopy with electro-conductive cantilever
    Ohara, K
    Cho, Y
    INTEGRATED FERROELECTRICS, 2002, 50 : 209 - 217
  • [3] Quantitative measurement of linear and nonlinear dielectric characteristics using scanning nonlinear dielectric microscopy
    Cho, YS
    Kazuta, S
    Ohara, K
    Odagawa, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (5B): : 3086 - 3089
  • [4] Quantitative measurement of linear and nonlinear dielectric characteristics using scanning nonlinear dielectric microscopy
    Cho, Yasuo
    Kazuta, Satoshi
    Ohara, Koya
    Odagawa, Hiroyuki
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2000, 39 (5 B): : 3086 - 3089
  • [5] Quantitative microscopy of nonlinear dielectric constant using a scanning evanescent microwave microscopy
    Hu, Bo
    Liu, Wenhan
    Gao, Chen
    Zhu, Xiaohong
    Zheng, Dongning
    APPLIED PHYSICS LETTERS, 2006, 89 (04)
  • [6] Quantitative Measurement of Dopant Concentration Profiling by Scanning Nonlinear Dielectric Microscopy
    Ishikawa, Kenya
    Honda, Koichiro
    Cho, Yasuo
    NANOSCALE PHENOMENA IN FUNCTIONAL MATERIALS BY SCANNING PROBE MICROSCOPY, 2008, 1025
  • [7] Higher order nonlinear dielectric imaging using scanning nonlinear dielectric microscopy
    Cho, Y.
    Ohara, K.
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2001, 40 (6 B): : 4349 - 4353
  • [8] Higher order nonlinear dielectric imaging using scanning nonlinear dielectric microscopy
    Cho, Y
    Ohara, K
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2001, 40 (6B): : 4349 - 4353
  • [9] Scanning nonlinear dielectric microscopy
    Yasuo Cho
    Journal of Materials Research, 2011, 26 : 2007 - 2016
  • [10] Scanning nonlinear dielectric microscopy
    Cho, Y
    FERROELECTRIC THIN FILMS, 2005, 98 : 105 - 124
12345