Quantitative measurement of linear and nonlinear dielectric characteristics using scanning nonlinear dielectric microscopy

被引：0
|
作者：
Cho, Yasuo [1 ]
Kazuta, Satoshi [1 ]
Ohara, Koya [1 ]
Odagawa, Hiroyuki [1 ]
机构：
[1] Tohoku Univ, Sendai, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 2000年 / 39卷 / 5 B期
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摘要：
Permittivity measurement
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页码：3086 / 3089
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