Automatic sampling for CMM inspection planning of free-form surfaces

被引:103
|
作者
Elkott, DF [1 ]
Elmaraghy, HA [1 ]
Elmaraghy, WH [1 ]
机构
[1] Univ Windsor, Intelligent Mfg Syst Ctr, Windsor, ON N9B 3P4, Canada
关键词
D O I
10.1080/00207540210133435
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Coordinate measuring machines (CMMs) are used to examine the conformity of the produced parts with the designer's intent. The inspection of free-form surfaces is a difficult process due to their complexity and irregularity. Many tasks are performed to ensure a reliable and efficient inspection using CMMs. Sampling is an essential and vital step in inspection planning. Efficient and reliable approaches to determine the locations of the points to be sampled from free-form surfaces using the CMM were developed. Four heuristic algorithms for sampling based on the NURBS features of free-form surfaces are presented. The sampling criteria are equiparametric, surface patch size and the surface patch mean curvature. An algorithm for automatic selection of sampling algorithms performs complexity checks on NURBS surfaces, including the surface curvature changes and surface patch size changes, and selects the suitable sampling algorithm. Extensive simulations were performed using the developed methodologies to evaluate their performance using free-form surfaces with different degrees of complexity and compared with the uniform sampling pattern. The CMM measurement errors and manufacturing form errors have been simulated in these studies. The developed algorithms provide a useful tool in selecting the effective sampling plans for the tactile CMM inspection planning of free-form surfaces.
引用
收藏
页码:2653 / 2676
页数:24
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