Reducing surface loss in 3D microwave copper cavities for superconducting transmon qubits

被引:0
|
作者
Bogorin, Daniela F. [1 ]
Ware, Matthew [1 ]
McClure, D. T. [2 ,3 ]
Sorokanich, Stephen [1 ]
Plourde, B. L. T. [1 ]
机构
[1] Syracuse Univ, Dept Phys, Syracuse, NY 13244 USA
[2] IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA
[3] Syracuse, New York, NY 13244 USA
基金
美国国家科学基金会;
关键词
superconducting qubits; cavity quality factor; transmon; 3D cavity resonators; cQED; QUANTUM; CIRCUITS;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The recent implementation of three-dimensional microwave cavities coupled to superconducting transmon qubits has led to dramatic improvements in qubit coherence times [1]. Besides the superconducting aluminum cavities that have been used in many such measurements, other recent experiments have utilized copper cavities [2] with coherence times now approaching 0.1 ms. We are investigating the effects on the quality factor for three-dimensional copper cavities that have the cavity-wall surfaces electropolished and coated with a superconducting tin layer. The copper base provides a good path for thermalizing the cavity walls and qubit chip, while the surface treatment reduces the microwave loss. We have measured a superconducting transmon qubit in such a cavity and we report our low-temperature coherence results on the same qubit and cavity measured in two different labs.
引用
收藏
页数:3
相关论文
共 50 条
  • [41] Reducing intricacy of 3D space for 3D camera
    Mannan, S. M.
    Malik, Aamir S.
    Choi, Tae-Sun
    2008 IEEE INTERNATIONAL SYMPOSIUM ON CONSUMER ELECTRONICS, VOLS 1 AND 2, 2008, : 497 - 500
  • [42] Superconducting microwave cavities based on Nb3Sn electrolytic coatings
    Kolosov, V. N.
    Shevyrev, A. A.
    INORGANIC MATERIALS, 2010, 46 (12) : 1313 - 1320
  • [43] Magnetically Defined Qubits on 3D Topological Insulators
    Ferreira, Gerson J.
    Loss, Daniel
    PHYSICAL REVIEW LETTERS, 2013, 111 (10)
  • [44] Superconducting microwave cavities based on Nb3Sn electrolytic coatings
    V. N. Kolosov
    A. A. Shevyrev
    Inorganic Materials, 2010, 46 : 1313 - 1320
  • [45] Reducing the complexity of medical 3D surface models for interactive analysis
    Lind, PD
    Jensen, HW
    CAR '96: COMPUTER ASSISTED RADIOLOGY, 1996, 1124 : 1011 - 1011
  • [46] Thermal and Residual Excited-State Population in a 3D Transmon Qubit
    Jin, X. Y.
    Kamal, A.
    Sears, A. P.
    Gudmundsen, T.
    Hover, D.
    Miloshi, J.
    Slattery, R.
    Yan, F.
    Yoder, J.
    Orlando, T. P.
    Gustavsson, S.
    Oliver, W. D.
    PHYSICAL REVIEW LETTERS, 2015, 114 (24)
  • [47] Simulation and Measurement of the Vacuum Rabi Coupling g in a 3D Transmon System
    Son, Jinsu
    Choi, Gahyun
    Noh, Taewan
    Choi, Jisoo
    Park, Gwanyeol
    Lee, Joonyoung
    Kang, Byeongwon
    Park, Kibog
    Lee, Kwan-Woo
    Lee, Soon-Gul
    Song, Woon
    Chong, Yonuk
    2019 IEEE INTERNATIONAL SUPERCONDUCTIVE ELECTRONICS CONFERENCE (ISEC), 2019,
  • [48] 3D Muography for the Search of Hidden Cavities
    Cimmino, Luigi
    Baccani, Guglielmo
    Noli, Pasquale
    Amato, Lucio
    Ambrosino, Fabio
    Bonechi, Lorenzo
    Bongi, Massimo
    Ciulli, Vitaliano
    D'Alessandro, Raffaello
    D'Errico, Mariaelena
    Gonzi, Sandro
    Melon, Barbara
    Minin, Gianluca
    Saracino, Giulio
    Scognamiglio, Luca
    Strolin, Paolo
    Viliani, Lorenzo
    SCIENTIFIC REPORTS, 2019, 9 (1)
  • [49] 3D Muography for the Search of Hidden Cavities
    Luigi Cimmino
    Guglielmo Baccani
    Pasquale Noli
    Lucio Amato
    Fabio Ambrosino
    Lorenzo Bonechi
    Massimo Bongi
    Vitaliano Ciulli
    Raffaello D’Alessandro
    Mariaelena D’Errico
    Sandro Gonzi
    Barbara Melon
    Gianluca Minin
    Giulio Saracino
    Luca Scognamiglio
    Paolo Strolin
    Lorenzo Viliani
    Scientific Reports, 9
  • [50] 3D printed photopolymer structures with chemically deposited copper for microwave electronics
    Proyavin, M. D.
    Sobolev, D., I
    Vikharev, A. A.
    Fedotov, A. E.
    Peskov, N. Yu
    Shmelev, M. Yu
    Kuzikov, S., V
    Makhalov, P. B.
    IVEC 2021: 2021 22ND INTERNATIONAL VACUUM ELECTRONICS CONFERENCE, 2021,