Digital Signal Processing on Optoelectronic for SHM

This paper proposes a particular advantage of Support Vector Machine (SVM) to predict measurements errors for Accuracy Enhancement in Optical Scanning Systems, for position detection in real life application for Structural Health Monitoring (SHM) by a novel method, based on the Power Spectrum Centroid Calculation in determining the energy center of an optoelectronic signal. The Energy Signal Centre is found in the Power Spectrum Centroid and the SVM Regression Method is used as a digital rectified to increase measurement accuracy for Optical Scanning System.