The effect of resonant magnetic perturbations (RMPs) on particle transport is studied in the J-TEXT tokamak. It is found that for the discharges with an existing saturated 2/1 resistive tearing mode (TM), applied RMPs of moderate amplitude lead to a decrease in electron density with a relative amplitude Delta(n) over bar (e)/(n) over bar (e0) ranging from -3% to -10% in the plasma core, and the mode stabilization and electron temperature increase are observed simultaneously in this case. Sufficiently large amplitude of RMPs, however, leads to locked modes and much larger decrease in the electron density as well as in the electron temperature, with Delta(n) over bar (e)/(n) over bar (e0) approximate to -20%. For the discharges without 2/1 TMs, applied RMPs cause a relative density decrease Delta(n) over bar (e)/(n) over bar (e0) similar to -10% (-30%) before (after) field penetration. Using the two-fluid equations and experimental parameters as input, the nonlinear numerical results approximately agree with experimental observations.
机构:
College of Electrical and Electronic Engineering,Huazhong University of Science and Technology
State Key Laboratory of Advanced Electromagnetic Engineering and TechnologyCollege of Electrical and Electronic Engineering,Huazhong University of Science and Technology
张明
丁永华
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机构:
College of Electrical and Electronic Engineering,Huazhong University of Science and Technology
State Key Laboratory of Advanced Electromagnetic Engineering and TechnologyCollege of Electrical and Electronic Engineering,Huazhong University of Science and Technology
机构:
College of Electrical and Electronic Engineering,Huazhong University of Science and Technology
State Key Laboratory of Advanced Electromagnetic Engineering andCollege of Electrical and Electronic Engineering,Huazhong University of Science and Technology
张明
丁永华
论文数: 0引用数: 0
h-index: 0
机构:
College of Electrical and Electronic Engineering,Huazhong University of Science and Technology
State Key Laboratory of Advanced Electromagnetic Engineering andCollege of Electrical and Electronic Engineering,Huazhong University of Science and Technology