Ramp wear and debris from load/unload lift-tab roughness

被引:9
|
作者
Yaeger, JR [1 ]
机构
[1] Maxtor Corp, Milpitas, CA 95035 USA
关键词
debris; image processing; load/unload; particle measurements; ramp; surface roughness; wear;
D O I
10.1109/TMAG.2002.802695
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The technique of Suk et al. [1] is used to measure in-situ wear and debris generation versus suspension lift-tab roughness during ramp load/unload on a polyoxymethylene (POM) ramp. Image processing isolates depressed and raised portions on the ramp which are proportional to wear and debris, respectively. Both wear and debris grow logarithmically and are respectively proportional to average roughness (Ra) and peak roughness (Rp) as determined by Wyko measurements of the spherical lift-tab. As roughness tends toward zero, both are (not surprisingly) minimized. With a very smooth lift-tab wear is more accurately characterized as "deformation" and debris is almost absent. High roughness can increase initial coefficient of friction and require a substantial wearing-in period.
引用
收藏
页码:2126 / 2128
页数:3
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