Ramp wear induced contamination and its effect on load/unload performance

被引：0
|
作者：
Zhao, Q [1 ]
Talke, FE [1 ]
机构：
[1] Univ Calif San Diego, Ctr Magnet Recording Res, La Jolla, CA 92093 USA
来源：
JOURNAL OF INFORMATION STORAGE AND PROCESSING SYSTEMS | 2001年 / 3卷 / 3-4期
关键词：
wear; head/disk interface; load/unload;
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
The mechanism and characteristics of ramp wear in load/unload disk drives is investigated by examining the lift tab and the disk surface after load/unload testing using scanning electron and optical microscopy. The effect of contamination on the load/unload performance is studied by introducing polymer particles near the disk surface. The results indicate that ramp wear is a combination of delamination and abrasive wear. Acoustic emission measurements show that contamination can cause head/disk contact during load/unload, which in turn may cause disk damage.
引用
收藏
页码：207 / 212
页数：6
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